Scanning thermal microscopy

Annual Review of Materials Science

Volumn 29, Issue , 1999, Pages 505-585

  Majumdar, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC RESISTANCE; HEAT TRANSFER; NANOSTRUCTURED MATERIALS; PROBES; THERMAL EXPANSION; THERMAL VARIABLES CONTROL; THERMAL VARIABLES MEASUREMENT; THERMOMETERS;

SCANNING THERMAL MICROSCOPY; SPATIAL RESOLUTION; SPATIOTEMPORAL RESOLUTION; TEMPERATURE RESOLUTION; TEMPORAL RESOLUTION; THERMOVOLTAGE BASED MEASUREMENTS;

TEMPERATURE MEASUREMENT;

EID: 0033301083     PISSN: 00846600     EISSN: None     Source Type: Book    
DOI: 10.1146/annurev.matsci.29.1.505     Document Type: Book

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