|
Volumn 240, Issue 1-4, 2005, Pages 312-317
|
Microthermal machining using scanning thermal microscopy
|
Author keywords
High density data storage; Microthermal machining; Polymer; SThM
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
DATA REDUCTION;
ELECTRIC RESISTANCE;
MICROELECTRONIC PROCESSING;
POLYMERS;
SCANNING;
THERMAL EFFECTS;
THERMOANALYSIS;
HIGH DENSITY DATA STORAGE;
MICROTHERMAL MACHINING;
SILICON NITRIDES;
STHM;
MICROSCOPIC EXAMINATION;
|
EID: 10444242626
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.06.148 Document Type: Article |
Times cited : (23)
|
References (12)
|