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Volumn 73, Issue 1-2, 1999, Pages 89-94

5×5 2D AFM cantilever arrays a first step towards a Terabit storage device

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; DATA STORAGE EQUIPMENT; PARALLEL PROCESSING SYSTEMS; SCANNING; SENSORS; VLSI CIRCUITS;

EID: 0033537520     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00259-3     Document Type: Article
Times cited : (111)

References (14)
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    • Nanomechanisms and tips for microinstruments, Digest of Technical Papers
    • Yokohama, Japan, June 7-10
    • N.C. MacDonald, Nanomechanisms and tips for microinstruments, Digest of Technical Papers, 7th International Conference on Solid-State Sensors and Actuators, Yokohama, Japan, June 7-10, 1993, pp. 8-12.
    • (1993) 7th International Conference on Solid-State Sensors and Actuators , pp. 8-12
    • MacDonald, N.C.1
  • 6
    • 0026372168 scopus 로고
    • Atomic force microscopy using a piezoresistive cantilever
    • IEEE, Pennington, NJ, Publication No. 91CH2817-5
    • M. Tortonese, H. Yamada, R.C. Barrett, C.F. Quate, Atomic force microscopy using a piezoresistive cantilever, Proceedings of Transducers '91, IEEE, Pennington, NJ, 1991, Publication No. 91CH2817-5, pp. 448-451.
    • (1991) Proceedings of Transducers '91 , pp. 448-451
    • Tortonese, M.1    Yamada, H.2    Barrett, R.C.3    Quate, C.F.4
  • 7
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    • Piezoresistive effect in germanium and silicon
    • Smith C.S. Piezoresistive effect in germanium and silicon. Phys. Rev. 94:1954;42-49.
    • (1954) Phys. Rev. , vol.94 , pp. 42-49
    • Smith, C.S.1
  • 8
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    • Atomic resolution with an atomic force microscope using piezoresistive detection
    • Tortense M., Barret R.C., Quate C.F. Atomic resolution with an atomic force microscope using piezoresistive detection. Appl. Phys. Lett. 62:1993;834-836.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 834-836
    • Tortense, M.1    Barret, R.C.2    Quate, C.F.3
  • 9
    • 85031573398 scopus 로고    scopus 로고
    • U.S. Patent 5,379,425 (14th April 1998. Cantilever with integrated deflection sensor (assigned to IBM), U.S. Patent 5,444,244 (22nd August 1995). Piezoresistive cantilever with integral tip for scanning probe microscope (assigned to Park Scientific Instruments).
    • U.S. Patent 5,379,425 (14th April 1998). Cantilever with integrated deflection sensor (assigned to IBM), U.S. Patent 5,444,244 (22nd August 1995). Piezoresistive cantilever with integral tip for scanning probe microscope (assigned to Park Scientific Instruments).
  • 11
    • 85031563598 scopus 로고    scopus 로고
    • PCT patent application, filed 27 August 1994, with publication number WO 96/07074, and title Fine Positioning Apparatus with Atomic Resolution (currently assigned to International Business Machines).
    • PCT patent application, filed 27 August 1994, with publication number WO 96/07074, and title Fine Positioning Apparatus with Atomic Resolution (currently assigned to International Business Machines).
  • 12
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    • Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation
    • Minne S.C., Flueckiger Ph., Soh H.T., Quate C.F. Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation. J. Vac. Technol. B. 13:1995;1380-1385.
    • (1995) J. Vac. Technol. B , vol.13 , pp. 1380-1385
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.