Scanning thermal-conductivity microscope

Review of Scientific Instruments

Volumn 77, Issue 2, 2006, Pages

  Sarid, Dror ^a   McCarthy, Brendan ^a   Grover, Ranjan ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING THERMAL-CONDUCTIVITY MICROSCOPE; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; LASER BEAMS; SURFACE TOPOGRAPHY; THERMAL CONDUCTIVITY;

MICROSCOPES;

EID: 33644605193     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2168391     Document Type: Article

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