Measuring material softening with nanoscale spatial resolution using heated silicon probes

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Nelson, B A ^a   King, W P ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOCAL THERMAL ANALYSIS (LTA); NANOSCALE SPATIAL RESOLUTION; SILICON PROBES;

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; HEAT TREATMENT; SURFACE ROUGHNESS; THERMOANALYSIS; THIN FILMS;

POLYSTYRENES;

EID: 33847648386     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2435589     Document Type: Article

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