High-sensitivity nanometer-scale infrared spectroscopy using a contact mode microcantilever with an internal resonator paddle

Nanotechnology

Volumn 21, Issue 18, 2010, Pages

  Kjoller, K ^a   Felts, J R ^b   Cook, D ^a   Prater, C B ^a   King, W P ^b  

^a Anasys Instruments   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; CONTACT MODES; DIFFRACTION LIMITED; HIGH-SENSITIVITY; IR SPECTROSCOPY; MICRO-CANTILEVERS; NANO-METER-SCALE; ORGANIC LAYERS; SENSITIVITY IMPROVEMENTS; SHARP TIP; SPATIAL RESOLUTION; SYSTEM DESIGN; THERMOMECHANICAL DEFORMATIONS; TUNABLE LASERS;

ABSORPTION; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; IMAGE RESOLUTION; INFRARED SPECTROSCOPY; LASERS; NANOCANTILEVERS; ORGANIC LASERS;

ABSORPTION SPECTROSCOPY;

EID: 77950961749     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/18/185705     Document Type: Article

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