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Volumn 7, Issue 1, 1998, Pages 69-77

Low-stiffness silicon cantilevers with integrated heaters and piezoresistive sensors for high-density AFM thermomechanical data storage

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA RECORDING; DIGITAL STORAGE; MATHEMATICAL MODELS; PIEZOELECTRIC DEVICES; SILICON SENSORS; TEMPERATURE MEASUREMENT;

EID: 0032023865     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.661386     Document Type: Article
Times cited : (164)

References (35)
  • 1
    • 77952760920 scopus 로고
    • Microfabrication of cantilever styli for the atomic force microscope
    • T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate, "Microfabrication of cantilever styli for the atomic force microscope," J. Vac. Sci. Technol., vol. 8, pp. 3386-3396, 1990.
    • (1990) J. Vac. Sci. Technol. , vol.8 , pp. 3386-3396
    • Albrecht, T.R.1    Akamine, S.2    Carver, T.E.3    Quate, C.F.4
  • 2
    • 0026926271 scopus 로고
    • Silicon cantilevers and tips for scanning force microscopy
    • J. Brugger, R. A. Buser, and N. F. de Rooij, "Silicon cantilevers and tips for scanning force microscopy," Sens. Actuators A, vol. 34, pp. 193-200, 1992.
    • (1992) Sens. Actuators A , vol.34 , pp. 193-200
    • Brugger, J.1    Buser, R.A.2    De Rooij, N.F.3
  • 3
    • 84881605956 scopus 로고
    • Micromachined silicon sensors for scanning force microscopy
    • O. Wolter, Th. Bayer, and J. Greschner, "Micromachined silicon sensors for scanning force microscopy," J. Vac. Sci. Technol. B, vol. 9, pp. 1353-1357, 1991.
    • (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 1353-1357
    • Wolter, O.1    Bayer, Th.2    Greschner, J.3
  • 5
    • 0001488961 scopus 로고
    • Fabrication of Si nanostructures with an atomic force microscope
    • E. S. Snow and P. M. Campbell, "Fabrication of Si nanostructures with an atomic force microscope," Appl. Phys. Lett., vol. 64, pp. 1932-1934, 1994.
    • (1994) Appl. Phys. Lett. , vol.64 , pp. 1932-1934
    • Snow, E.S.1    Campbell, P.M.2
  • 6
    • 36449008120 scopus 로고
    • Fabrication of 0.1 μm metal oxide semiconductor field-effect transistors with the atomic force microscope
    • S. C. Minne, H. T. Soh, P. Flueckiger, and C. F. Quate, "Fabrication of 0.1 μm metal oxide semiconductor field-effect transistors with the atomic force microscope," Appl. Phys. Lett., vol. 66, pp. 703-705, 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 703-705
    • Minne, S.C.1    Soh, H.T.2    Flueckiger, P.3    Quate, C.F.4
  • 8
    • 36449009560 scopus 로고
    • Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy
    • R. Barrett and C. F. Quate, "Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy," J. Appl. Phys., vol. 70, pp. 2725-2733, 1991.
    • (1991) J. Appl. Phys. , vol.70 , pp. 2725-2733
    • Barrett, R.1    Quate, C.F.2
  • 9
    • 0009954275 scopus 로고
    • Nanometer recording on graphite and Si substrate using an atomic force microscope in air
    • S. Hosaka, H. Koyanagi, and A. Kikukawa,"Nanometer recording on graphite and Si substrate using an atomic force microscope in air," Jpn. J. Phys., vol. 32, pp. L464-467, 1993.
    • (1993) Jpn. J. Phys. , vol.32
    • Hosaka, S.1    Koyanagi, H.2    Kikukawa, A.3
  • 10
    • 36449009597 scopus 로고
    • Nanometer-scale recording on chalcogenide films with an atomic force microscope
    • H. Kado and T. Tohda, "Nanometer-scale recording on chalcogenide films with an atomic force microscope," Appl. Phys. Lett., vol. 66, pp. 2961-2962, 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2961-2962
    • Kado, H.1    Tohda, T.2
  • 11
    • 6144290977 scopus 로고
    • Thermomechanical writing with an atomic force microscope tip
    • H. J. Mamin and D. Rugar, "Thermomechanical writing with an atomic force microscope tip," Appl. Phys. Lett., vol. 61, pp. 1003-1005, 1992.
    • (1992) Appl. Phys. Lett. , vol.61 , pp. 1003-1005
    • Mamin, H.J.1    Rugar, D.2
  • 12
    • 0029296702 scopus 로고
    • Tip-based data storage using micromechanical cantilevers
    • H. J. Mamin, L. S. Fan, S. Hoen, and D. Rugar, "Tip-based data storage using micromechanical cantilevers," Sens. Actuators A, vol. 48, pp. 215-219, 1994.
    • (1994) Sens. Actuators A , vol.48 , pp. 215-219
    • Mamin, H.J.1    Fan, L.S.2    Hoen, S.3    Rugar, D.4
  • 13
    • 0027927104 scopus 로고
    • Thermomechanical data storage using a fiber optic stylus
    • S. Hoen, H. J. Mamin, and D. Rugar, "Thermomechanical data storage using a fiber optic stylus," Appl. Phys. Lett., vol. 64, pp. 267-269, 1994.
    • (1994) Appl. Phys. Lett. , vol.64 , pp. 267-269
    • Hoen, S.1    Mamin, H.J.2    Rugar, D.3
  • 14
    • 21544472129 scopus 로고
    • Atomic resolution with an atomic force microscope using piezoresistive detection
    • M. Tortonese, R. C. Barrett, and C. F. Quate, "Atomic resolution with an atomic force microscope using piezoresistive detection," Appl. Phys. Lett., vol. 62, pp. 834-836, 1993.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 834-836
    • Tortonese, M.1    Barrett, R.C.2    Quate, C.F.3
  • 15
    • 11744306149 scopus 로고
    • Ph.D. dissertation, Stanford University, Stanford, CA
    • M. Tortonese, Ph.D. dissertation, Stanford University, Stanford, CA, 1994.
    • (1994)
    • Tortonese, M.1
  • 16
  • 17
    • 0001520375 scopus 로고    scopus 로고
    • Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope
    • B. W. Chui, H. J. Mamin, B. D. Terris, T. D. Stowe, D. Rugar, and T. W. Kenny, "Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope," Appl. Phys. Lett., vol. 69, pp. 2767-2769, 1996.
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2767-2769
    • Chui, B.W.1    Mamin, H.J.2    Terris, B.D.3    Stowe, T.D.4    Rugar, D.5    Kenny, T.W.6
  • 19
    • 11744369845 scopus 로고    scopus 로고
    • IBIS Technology Corp., Danvers, MA 01923 USA
    • IBIS Technology Corp., Danvers, MA 01923 USA.
  • 20
    • 11744286711 scopus 로고    scopus 로고
    • Solecon Laboratories, San Jose, CA 95131 USA
    • Solecon Laboratories, San Jose, CA 95131 USA.
  • 21
    • 0031344594 scopus 로고    scopus 로고
    • 6-MHz 2-N/m piezoresistive atomic-force-microscope cantilevers with INCISIVE tips
    • R. P. Ried, H. J. Mamin, B. D. Terris, L. S. Fan, and D. Rugar, "6-MHz 2-N/m piezoresistive atomic-force-microscope cantilevers with INCISIVE tips," IEEE J. Microelectromech. Syst., vol. 6, no. 4, pp. 294-302, 1997.
    • (1997) IEEE J. Microelectromech. Syst. , vol.6 , Issue.4 , pp. 294-302
    • Ried, R.P.1    Mamin, H.J.2    Terris, B.D.3    Fan, L.S.4    Rugar, D.5
  • 22
    • 0012986514 scopus 로고    scopus 로고
    • Atomic force microscope based data storage; Track servo and wear study
    • to be published
    • B. D. Terris, S. A. Rishton, H. J. Mamin, R. P. Ried, and D. Rugar, "Atomic force microscope based data storage; Track servo and wear study," Appl. Phys. A, to be published.
    • Appl. Phys. A
    • Terris, B.D.1    Rishton, S.A.2    Mamin, H.J.3    Ried, R.P.4    Rugar, D.5
  • 23
    • 50149095145 scopus 로고
    • Electrical and optical characteristics of vacuum-sealed polysilicon microlamps
    • C. H. Mastrangelo, J. H.-J. Yeh, and R. S. Muller, "Electrical and optical characteristics of vacuum-sealed polysilicon microlamps," IEEE Trans. Electron Devices, vol. 39, pp. 1363-75, 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 1363-1375
    • Mastrangelo, C.H.1    Yeh, J.H.-J.2    Muller, R.S.3
  • 24
    • 0009184564 scopus 로고
    • Micromachined field emission cathode with an integrated heater
    • J. H. Das and N. C. MacDonald, "Micromachined field emission cathode with an integrated heater," J. Vac. Sci. Technol. B, vol. 13, pp. 2432-2435, 1995.
    • (1995) J. Vac. Sci. Technol. B , vol.13 , pp. 2432-2435
    • Das, J.H.1    MacDonald, N.C.2
  • 25
    • 0000543677 scopus 로고    scopus 로고
    • Thermal writing using a heated atomic force microscope tip
    • H. J. Mamin, "Thermal writing using a heated atomic force microscope tip," Appl. Phys. Lett., vol. 69, pp. 433-435, 1996.
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 433-435
    • Mamin, H.J.1
  • 27
    • 0000290832 scopus 로고
    • Thermal conductivity of pure and impure silicon, silicon carbide, and diamond
    • G. A. Slack, "Thermal conductivity of pure and impure silicon, silicon carbide, and diamond," J. Appl. Phys., vol. 35, pp. 3460-3466, 1964.
    • (1964) J. Appl. Phys. , vol.35 , pp. 3460-3466
    • Slack, G.A.1
  • 28
    • 0026204173 scopus 로고
    • Transport properties of silicon
    • L. Weber and E. Gmelin, "Transport properties of silicon," Appl. Phys. A, vol. 53, pp. 136-140, 1991.
    • (1991) Appl. Phys. A , vol.53 , pp. 136-140
    • Weber, L.1    Gmelin, E.2
  • 29
    • 0031998367 scopus 로고    scopus 로고
    • Temperature-dependent thermal conductivity of single-crystal silicon layers in SOI substrates
    • M. Asheghi, M. N. Touzelbaev, Y. K. Leung, S. S. Wong, and K. E. Goodson, "Temperature-dependent thermal conductivity of single-crystal silicon layers in SOI substrates," ASME J. Heat Transfer, vol. 120, pp. 1-7, 1998.
    • (1998) ASME J. Heat Transfer , vol.120 , pp. 1-7
    • Asheghi, M.1    Touzelbaev, M.N.2    Leung, Y.K.3    Wong, S.S.4    Goodson, K.E.5
  • 31
    • 0027812558 scopus 로고
    • Micro-temperature measurements on semiconductor laser mirrors by reflectance modulation: A newly developed technique for laser characterization
    • P. W. Epperlein, "Micro-temperature measurements on semiconductor laser mirrors by reflectance modulation: A newly developed technique for laser characterization," Jpn. J. Appl. Phys., vol. 32, pp. 5514-5522, 1993.
    • (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 5514-5522
    • Epperlein, P.W.1
  • 34
    • 20744442768 scopus 로고
    • Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators
    • S. C. Minne, S. R. Manalis, and C. F. Quate, "Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators," Appl. Phys. Lett., vol. 67, pp. 3918-3920, 1995.
    • (1995) Appl. Phys. Lett. , vol.67 , pp. 3918-3920
    • Minne, S.C.1    Manalis, S.R.2    Quate, C.F.3
  • 35
    • 0039815370 scopus 로고    scopus 로고
    • Independent parallel lithography using the atomic force microscope
    • S. C. Minne, S. R. Manalis, A. Atalar, and C. F. Quate, "Independent parallel lithography using the atomic force microscope," J. Vac. Technol. B, vol. 14, pp. 2456-2459, 1996.
    • (1996) J. Vac. Technol. B , vol.14 , pp. 2456-2459
    • Minne, S.C.1    Manalis, S.R.2    Atalar, A.3    Quate, C.F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.