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Volumn , Issue , 2009, Pages 1963-1966

Feedback enhanced thermo-electric topography sensing

Author keywords

Micro cantilevers; Thermo electric sensing; Topography sensing

Indexed keywords

ELECTRIC SENSORS; LOW COSTS; MICRO-CANTILEVERS; SILICON CANTILEVER; TEMPERATURE-DEPENDENT CONDUCTIVITY; TOPOGRAPHY SENSING;

EID: 71449108446     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2009.5285675     Document Type: Conference Paper
Times cited : (6)

References (7)
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    • (1998) J. Microelectromech. Syst , vol.7 , Issue.1 , pp. 69-78
    • Chui, B.W.1
  • 2
    • 51349118968 scopus 로고    scopus 로고
    • Probe-based ultrahigh-density storage technology
    • A. Pantazi et al., "Probe-based ultrahigh-density storage technology", IBM J. Res. & Dev., vol. 52(4/5), pp. 493-511, 2008.
    • (2008) IBM J. Res. & Dev , vol.52 , Issue.4-5 , pp. 493-511
    • Pantazi, A.1
  • 3
    • 0035821102 scopus 로고    scopus 로고
    • Micro-thermal analysis: Techniques and applications
    • H.M. Pollock and A. Hammiche, "Micro-thermal analysis: techniques and applications", J. Phys. D: Appl. Phys., vol. 34, pp. R23-R53, 2001.
    • (2001) J. Phys. D: Appl. Phys , vol.34
    • Pollock, H.M.1    Hammiche, A.2
  • 4
    • 49149094516 scopus 로고    scopus 로고
    • Temperature study of sub-micrometric ICs by scanning thermal microscopy
    • S. Gomés et al., "Temperature study of sub-micrometric ICs by scanning thermal microscopy", IEEE Trans. Compon. Packag. Technol., vol. 30, pp. 424-431, 2007.
    • (2007) IEEE Trans. Compon. Packag. Technol , vol.30 , pp. 424-431
    • Gomés, S.1
  • 5
    • 27944455145 scopus 로고    scopus 로고
    • Design analysis of heated atomic force microscope cantilevers for nanotopography measurements
    • W.P. King, "Design analysis of heated atomic force microscope cantilevers for nanotopography measurements", J. Micromech. Microeng., vol. 15, pp. 2441-2448, 2005.
    • (2005) J. Micromech. Microeng , vol.15 , pp. 2441-2448
    • King, W.P.1
  • 6
    • 65949096521 scopus 로고    scopus 로고
    • Design of Power-Optimized Thermal Cantilevers for Scanning Probe Topography Sensing
    • Sorrento, Italy, January 25-29
    • H. Rothuizen et al., "Design of Power-Optimized Thermal Cantilevers for Scanning Probe Topography Sensing", Proc. IEEE MEMS Conference, Sorrento, Italy, January 25-29, 2009, pp. 603-606.
    • (2009) Proc. IEEE MEMS Conference , pp. 603-606
    • Rothuizen, H.1
  • 7
    • 49149106506 scopus 로고    scopus 로고
    • Modeling and experimental identification of silicon micro-heater dynamics: A systems approach
    • A. Sebastian and D. Wiesmann, "Modeling and experimental identification of silicon micro-heater dynamics: A systems approach", J. Microelectromech. Syst., vol. 17(4), pp. 911-920, 2008.
    • (2008) J. Microelectromech. Syst , vol.17 , Issue.4 , pp. 911-920
    • Sebastian, A.1    Wiesmann, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.