A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films

Applied Physics Letters

Volumn 96, Issue 6, 2010, Pages

  Zhang, Yanliang ^a   Hapenciuc, Claudiu L ^a   Castillo, Eduardo E ^a   Borca Tasciuc, Theodorian ^a   Mehta, Rutvik J ^a   Karthik, Chinnathambi ^a   Ramanath, Ganpati ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIR CONDUCTION; ALTERNATIVE CURRENT; BULK VALUE; CONTACT AREAS; EFFECTIVE MEDIA THEORY; FILM POROSITY; INDEPENDENT MEASUREMENT; MICRO-PROBES; MICRO-SCALES; MICROFABRICATED; MICROWIRE; ROUGH SURFACES; SEEBECK VOLTAGE; SPATIAL RESOLUTION; TEST STRUCTURE; THERMAL RESISTANCE; VOLTAGE ELECTRODES;

HEAT RESISTANCE; PROBES; SEMICONDUCTING SELENIUM COMPOUNDS; SULFUR; TELLURIUM COMPOUNDS; THERMAL CONDUCTIVITY; THERMOANALYSIS; THIN FILMS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 76749152002     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3300826     Document Type: Article

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