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Volumn 69, Issue 18, 1996, Pages 2767-2769
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Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001520375
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117669 Document Type: Article |
Times cited : (96)
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References (26)
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