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Volumn 69, Issue 18, 1996, Pages 2767-2769

Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001520375     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117669     Document Type: Article
Times cited : (96)

References (26)
  • 16
    • 5544257519 scopus 로고
    • Ph.D. thesis, Stanford University
    • M. Tortonese, Ph.D. thesis, Stanford University, 1994.
    • (1994)
    • Tortonese, M.1
  • 19
    • 85033845907 scopus 로고    scopus 로고
    • IBIS Technology Corp., 32A Cherry Hill Drive, Danvers, MA 01923
    • IBIS Technology Corp., 32A Cherry Hill Drive, Danvers, MA 01923.
  • 22
    • 85033855071 scopus 로고    scopus 로고
    • Solecon Laboratories, 2241 Paragon Drive, San Jose, CA 95131
    • Solecon Laboratories, 2241 Paragon Drive, San Jose, CA 95131.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.