Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes

Applied Physics Letters

Volumn 77, Issue 26, 2000, Pages 4295-4297

  Shi, Li ^a   Plyasunov, Sergei ^b   Bachtold, Adrian ^b   McEuen, Paul L ^b   Majumdar, Arunava ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001101438     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1334658     Document Type: Article

References (14)

1. M. S. Dresselhaus, G. Dresselhaus, and P. C. Eklund, Science of Fullerenes and Carbon Nanotubes (Academic, New York, 1996).
2. J. Hu, O. Min, P. Yang, and C. M. Lieber, Nature (London) 399, 48 (1999).
3. A. P. Alivisatos, Science 271, 933 (1996).
4. N. Khurana and C.-L. Chiang, IEEE Proc. Int. Reliab. Physics Symp., 1986, p. 189.
5. Y. S. Ju and K. E. Goodson, J. Heat Transfer 120, 306 (1998).
6. A. Majumdar, Annu. Rev. Mater. Sci. 29, 505 (1999).
7. K. Luo, Z. Shi, J. Varesi, and A. Majumdar, J. Vac. Sci. Technol. B 15, 349 (1997).
8. R. J. Pylkki and P. E. West, Jpn. J. Appl. Phys., Part 1 33, 3785 (1994).
9. T. Leinhos, M. Stopka, and E. Oesterschulze, Appl. Phys. A: Mater. Sci. Process. 66, 65 (1998).
10. Y. Zhang, Y. Zhang, J. Blaser, T. S. Sriram, A. Enver, and R. B. Marcus, Rev. Sci. Instrum. 69, 2081 (1998).
11. G. Mills, H. Zhou, A. Midha, L. Donaldson, and J. M. R. Weaver, Appl. Phys. Lett. 72, 2900 (1998).
12. L. Shi, O. Kwon, G. Wu, and A. Majumdar, ASME Int. Mech. Eng. Congress & Exposition, MEMS 1, 93 (1999). The details of the modeling, design, and fabrication process of the thermal probes will be published in a separate article.
13. L. Shi, O. Kwon, G. Wu, and A. Majumdar, IEEE Proc. Int. Reliab. Physics Symp., 2000, p. 394.
14. The details of the SThM study of carbon nanotube circuits will be published elsewhere.