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Volumn 7, Issue 2, 1996, Pages 142-150

Sub-surface imaging by scanning thermal microscopy

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[No Author keywords available]

Indexed keywords


EID: 0039103261     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/2/004     Document Type: Article
Times cited : (114)

References (15)
  • 1
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    • Thermal wave imaging
    • Rosencwaig A 1982 Thermal wave imaging Science 218 223-8
    • (1982) Science , vol.218 , pp. 223-228
    • Rosencwaig, A.1
  • 2
    • 0021439902 scopus 로고
    • Non-contact thermal wave imaging of sub-surface structures with infrared-detection
    • Emert H F H, Dacol F H, Melcher R L and Baumann T 1984 Non-contact thermal wave imaging of sub-surface structures with infrared-detection Appl. Phys. Lett. 44 1136-8
    • (1984) Appl. Phys. Lett. , vol.44 , pp. 1136-1138
    • Emert, H.F.H.1    Dacol, F.H.2    Melcher, R.L.3    Baumann, T.4
  • 3
    • 51149205514 scopus 로고
    • Thermo-optical spectroscopy: Detection by the "mirage effect"
    • Boccara A C, Fournier D and Badoz J 1980 Thermo-optical spectroscopy: detection by the "mirage effect" Appl. Phys. Lett. 36 130-2
    • (1980) Appl. Phys. Lett. , vol.36 , pp. 130-132
    • Boccara, A.C.1    Fournier, D.2    Badoz, J.3
  • 4
    • 3643130660 scopus 로고
    • Non-contact photoacoustic measurements of semiconductors with Michelson interferometry
    • Suemune I, Yamamoto H and Yamanishi M 1985 Non-contact photoacoustic measurements of semiconductors with Michelson interferometry J. Appl. Phys. 58 615-17
    • (1985) J. Appl. Phys. , vol.58 , pp. 615-617
    • Suemune, I.1    Yamamoto, H.2    Yamanishi, M.3
  • 6
    • 0021391485 scopus 로고
    • Photoacoustic spectroscospy of semiconductor heterostructures
    • Kubota K, Murai H and Nakatsu H 1984 Photoacoustic spectroscospy of semiconductor heterostructures J. Appl. Phys. 55 1520-4
    • (1984) J. Appl. Phys. , vol.55 , pp. 1520-1524
    • Kubota, K.1    Murai, H.2    Nakatsu, H.3
  • 8
    • 20544448056 scopus 로고
    • Thermal imaging using the atomic force microscope
    • Majumdar A, Carrejo J P and Lai J 1993 Thermal imaging using the atomic force microscope Appl. Phys. Lett. 62 2501-3
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 2501-2503
    • Majumdar, A.1    Carrejo, J.P.2    Lai, J.3
  • 9
    • 0000832716 scopus 로고
    • Thermal conductivity contrast imaging with a scanning thermal microscope
    • ed T W Tong (Lancaster, PA: Technomics)
    • Dinwiddie R B, Pylkki R J and West P E 1994 Thermal conductivity contrast imaging with a scanning thermal microscope Thermal Conductivity ed T W Tong (Lancaster, PA: Technomics) p 22
    • (1994) Thermal Conductivity , pp. 22
    • Dinwiddie, R.B.1    Pylkki, R.J.2    West, P.E.3
  • 13
    • 0028733074 scopus 로고
    • Characterising polymer surfaces - Nanoindentation, surface force data, calorimetric microscopy
    • Lawson N S, Ion R H, Pollock H M, Hourston D J and Reading M 1994 Characterising polymer surfaces - nanoindentation, surface force data, calorimetric microscopy Phys. Scr. T55 199-205
    • (1994) Phys. Scr. , vol.T55 , pp. 199-205
    • Lawson, N.S.1    Ion, R.H.2    Pollock, H.M.3    Hourston, D.J.4    Reading, M.5
  • 14
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    • Scanning thermal microscopy: Sub-surface imaging, thermal mapping of polymer blends, localised calorimetry
    • to be published
    • Hammiche A, Hourston D J, Pollock H M, Reading M and Song M 1996 Scanning thermal microscopy: sub-surface imaging, thermal mapping of polymer blends, localised calorimetry J. Vac. Sci. Technol. B to be published
    • (1996) J. Vac. Sci. Technol. B
    • Hammiche, A.1    Hourston, D.J.2    Pollock, H.M.3    Reading, M.4    Song, M.5
  • 15
    • 0001569056 scopus 로고
    • Modulated differential scanning calorimetry - A new way forward in materials characterization
    • Reading M 1993 Modulated differential scanning calorimetry - a new way forward in materials characterization Trends Polym. Sci. 1 248-53
    • (1993) Trends Polym. Sci. , vol.1 , pp. 248-253
    • Reading, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.