Thermal infrared near-field spectroscopy

Nano Letters

Volumn 12, Issue 3, 2012, Pages 1475-1481

  Jones, Andrew C ^a   Raschke, Markus B ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

chemical spectroscopy; evanescent fields; near field imaging; Thermal near fields; vibrational spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); ENERGY DENSITY; EVANESCENT FIELDS; EXPERIMENTAL CHARACTERIZATION; FAR-FIELD; FIELD LOCALIZATION; FOURIER TRANSFORM SPECTROSCOPY; KIRCHHOFF; LOCAL DENSITY OF STATE; MIDINFRARED; MODEL CALCULATIONS; NANO SCALE; NEAR FIELD IMAGING; NEAR-FIELD; NEAR-FIELD SPECTROSCOPY; OFF-RESONANCE; OPTICAL ANTENNAS; OPTICAL FORCE; ORDERS OF MAGNITUDE; PHONON-POLARITON; RADIATIVE HEAT TRANSFER; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SPECTRAL CHARACTERISTICS; THERMAL EMISSIONS; THERMAL INFRARED; THERMAL NEAR-FIELDS; THERMAL SOURCE;

ANTENNAS; ATOMIC FORCE MICROSCOPY; ELECTROMAGNETISM; INFRARED RADIATION; NANOTECHNOLOGY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; VIBRATIONAL SPECTROSCOPY;

PHONONS;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; NANOTECHNOLOGY; NEAR INFRARED SPECTROSCOPY; THERMOGRAPHY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; SPECTROSCOPY, NEAR-INFRARED; THERMOGRAPHY;

EID: 84858216779     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl204201g     Document Type: Article

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