Contact potential measurement using a heated atomic force microscope tip

Applied Physics Letters

Volumn 91, Issue 14, 2007, Pages

  Remmert, Jessica L ^a   Wu, Yan ^a   Lee, Jungchul ^a   Shannon, Mark A ^a   King, William P ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; GOLD; METALLIC FILMS; SEEBECK COEFFICIENT;

BIASED GOLD FILMS; CONTACT POTENTIAL MEASUREMENTS; HEATED ATOMIC FORCE MICROSCOPE TIPS; THERMOELECTRIC PROPERTIES;

FORCE MEASUREMENT;

EID: 34948890144     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2789927     Document Type: Article

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