Ultrahigh-density atomic force microscopy data storage with erase capability

Applied Physics Letters

Volumn 74, Issue 9, 1999, Pages 1329-1331

  Binnig, G ^a   Despont, M ^a   Drechsler, U ^a   Haberle W ^a   Lutwyche, M ^a   Vettiger, P ^a   Mamin, H J ^b   Chui, B W ^c   Kenny, T W ^c  

^a IBM RESEARCH ZURICH   (Switzerland)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARD DISK STORAGE; HEAT TRANSFER; HEATING; HIGH TEMPERATURE OPERATIONS; OPTICAL DATA STORAGE; PHOTORESISTS; POLYCARBONATES; POLYMETHYL METHACRYLATES; SILICON; SUBSTRATES;

ATOMIC FORCE MICROSCOPY THERMOMECHANICAL DATA STORAGE; ERASING; HEATER CANTILEVER; SILICON CANTILEVERS; STORAGE DENSITY; THERMAL READBACK METHOD; THERMOMECHANICAL WRITING;

ATOMIC FORCE MICROSCOPY;

EID: 0033092584     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123540     Document Type: Article

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