Thermal writing using a heated atomic force microscope tip

Applied Physics Letters

Volumn 69, Issue 3, 1996, Pages 433-435

  Mamin, H J ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000543677     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118085     Document Type: Article

References (11)

1. M. Tortonese, H. Yamada, R. C. Barrett, and C. F. Quate, IEEE 91CH2817-5, 448 (1991).
2. M. Tortonese, R. C. Barrett, and C. F. Quate, Appl. Phys. Lett. 62, 834 (1993).
3. H. J. Mamin and D. Rugar, Appl. Phys. Lett. 61, 1003 (1992).
4. H. Kado and T. Tohda, Appl. Phys. Lett. 66, 2961 (1995).
5. S. Hoen, H. J. Mamin, and D. Rugar, Appl. Phys. Lett. 64, 267 (1994).
6. Courtesy of Park Scientific Instruments, 1171 Borregas Ave., Sunnyvale, CA, 94089.
7. C. H. Mastrangelo, J. H.-J. Yeh, and R. S. Muller, IEEE Trans. Electron Devices ED-39, 1363 (1992).
8. Park Scientific Instruments, 1171 Borregas Ave., Sunnyvale, CA 94089.
9. J. S. Foster, K. A. Rubin, and D. Rugar, U.S. Patent No. 4 916 688 (1990).
10. A. Sato and Y. Tsukamoto, Nature 363, 431 (1993).
11. A. Sato, S. Momose, and Y. Tsukamoto, J. Vac. Sci. Technol. B 13, 2823 (1995).