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Volumn 15, Issue 1, 2005, Pages 237-243

Ultracompliant thermal probe array for scanning non-planar surfaces without force feedback

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; MICROSCOPIC EXAMINATION; POLYIMIDES; SANDWICH STRUCTURES; SCANNING; STRUCTURAL DESIGN; SURFACE TOPOGRAPHY; THERMAL EFFECTS;

EID: 12344257700     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/1/033     Document Type: Article
Times cited : (13)

References (15)
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    • Micro-thermal analysis: Techniques and applications
    • Pollock H M and Hammiche A 2001 Micro-thermal analysis: techniques and applications J. Phys. D: Appl. Phys. 34 23-53
    • (2001) J. Phys. D: Appl. Phys. , vol.34 , pp. 23-53
    • Pollock, H.M.1    Hammiche, A.2
  • 3
    • 0037716784 scopus 로고    scopus 로고
    • Applications of a low contact force polyimide shank bolometer probe for chemical and biological diagnostics
    • Li M H, Lee J H, Menon A K and Gianchandani Y B 2003 Applications of a low contact force polyimide shank bolometer probe for chemical and biological diagnostics Sensors Actuators A 104 236-45
    • (2003) Sensors Actuators A , vol.104 , pp. 236-245
    • Li, M.H.1    Lee, J.H.2    Menon, A.K.3    Gianchandani, Y.B.4
  • 6
    • 0036601154 scopus 로고    scopus 로고
    • Microprobe array with electrical interconnection for thermal imaging and data storage
    • Lee D W, Ono T, Abe T and Esashi M 2002 Microprobe array with electrical interconnection for thermal imaging and data storage J. Microelectromech. Syst. 11 215-21
    • (2002) J. Microelectromech. Syst. , vol.11 , pp. 215-221
    • Lee, D.W.1    Ono, T.2    Abe, T.3    Esashi, M.4
  • 8
    • 0034317532 scopus 로고    scopus 로고
    • Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics
    • Akiyama T, Staufer U, de Rooij N F, Lange D, Hagleitner C, Brand O, Baltes H, Tonin A and Hidber H R 2000 Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics J. Vac. Sci. Technol. B 18 2669-75
    • (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 2669-2675
    • Akiyama, T.1    Staufer, U.2    De Rooij, N.F.3    Lange, D.4    Hagleitner, C.5    Brand, O.6    Baltes, H.7    Tonin, A.8    Hidber, H.R.9
  • 12
    • 0033301083 scopus 로고    scopus 로고
    • Scanning thermal microscopy
    • Majumdar A 1999 Scanning thermal microscopy Annu. Rev. Mater. Sci. 29 505-85
    • (1999) Annu. Rev. Mater. Sci. , vol.29 , pp. 505-585
    • Majumdar, A.1
  • 14
    • 3042551464 scopus 로고    scopus 로고
    • A scanning thermal probe with servo-controlled interface circuit for microcalorimetry and other applications
    • Lee J-H and Gianchandani Y B 2004 A scanning thermal probe with servo-controlled interface circuit for microcalorimetry and other applications Rev. Sci. Instrum. 75 1222-7
    • (2004) Rev. Sci. Instrum. , vol.75 , pp. 1222-1227
    • Lee, J.-H.1    Gianchandani, Y.B.2
  • 15
    • 12344294177 scopus 로고    scopus 로고
    • A temperature dithering closed-loop interface circuit for a scanning microscopy system
    • at press
    • Lee J-H and Gianchandani Y B 2005 A temperature dithering closed-loop interface circuit for a scanning microscopy system IEEE/ASME J. Microelectromech. Syst. 14 (1) at press
    • (2005) IEEE/ASME J. Microelectromech. Syst. , vol.14 , Issue.1
    • Lee, J.-H.1    Gianchandani, Y.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.