Thermoelectric voltage at a nanometer-scale heated tip point contact

Nanotechnology

Volumn 23, Issue 3, 2012, Pages

  Fletcher, Patrick C ^a   Lee, Byeonghee ^a   King, William P ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; GOLD SUBSTRATES; GOLD-COATED; HEATER TEMPERATURES; INTERFACE TEMPERATURES; NANO-METER-SCALE; SINGLE CRYSTAL SILICON; TEMPERATURE RANGE; THERMAL CONTACT RESISTANCE; THERMOCOUPLE JUNCTIONS; THERMOELECTRIC VOLTAGE;

ATOMIC FORCE MICROSCOPY; CONTACT RESISTANCE; GLASS; GOLD; GOLD COATINGS; NANOCANTILEVERS; PLATINUM; QUARTZ; SILICON WAFERS; SINGLE CRYSTALS; SUBSTRATES; THERMOCOUPLES;

INTERFACES (MATERIALS);

EID: 84862936096     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/3/035401     Document Type: Article

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