Room-temperature chemical vapor deposition and mass detection on a heated atomic force microscope cantilever

Applied Physics Letters

Volumn 88, Issue 3, 2006, Pages 1-3

  Sunden, Erik O ^a   Wright, Tanya L ^a   Lee, Jungchul ^a   King, William P ^a   Graham, Samuel ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILLEVER; MASS DETECTION; ROOM TEMPERATURE;

ATOMIC FORCE MICROSCOPY; CALIBRATION; GROWTH (MATERIALS); HEAT TREATMENT; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE MEASUREMENT;

CHEMICAL VAPOR DEPOSITION;

EID: 31144442532     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2164916     Document Type: Article

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