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Volumn 87, Issue 6, 1999, Pages 1012-1013
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High-Density Data Storage Based on the Atomic Force Microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 85008008479
PISSN: 00189219
EISSN: 15582256
Source Type: Journal
DOI: 10.1109/JPROC.1999.763313 Document Type: Editorial |
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Times cited : (7)
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References (0)
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