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Volumn 361, Issue 1-2, 2000, Pages 113-120
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An introduction to μTA(TM) and its application to the study of interfaces
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Author keywords
Interface; Interphase; Localized differential thermal analysis; Localized thermomechanical analysis; Scanning probe thermal microscopy
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Indexed keywords
ANALYTIC METHOD;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
HEAT TRANSFER;
SCANNING ELECTRON MICROSCOPY;
THERMAL ANALYSIS;
THERMAL CONDUCTIVITY;
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EID: 0034601730
PISSN: 00406031
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6031(00)00552-9 Document Type: Article |
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Times cited : (49)
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References (11)
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