SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 93, Issue 20, 2008, Pages

Quantitative scanning thermal microscopy using double scan technique

(7) Kim, Kyeongtae a Chung, Jaehoon a Won, Jongbo a Kwon, Ohmyoung a Lee, Joon Sik b Park, Seung Ho c Choi, Young Ki d

a Korea University (South Korea)

b Seoul National University (South Korea)

c Hong Ik University (South Korea)

d Chung Ang University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT EXCHANGERS; HEAT TRANSFER; HEATING EQUIPMENT; SCANNING; TEMPERATURE MEASUREMENT; THERMOANALYSIS; THERMODYNAMIC PROPERTIES;

DOUBLE SCANS; LOCAL TEMPERATURES; QUANTITATIVE MEASUREMENTS; SCANNING THERMAL MICROSCOPES; SCANNING THERMAL MICROSCOPIES; SPATIAL RESOLUTIONS; THEORETICAL MODELS; THERMOPHYSICAL PROPERTIES;

AIR;

EID: 56849087622 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3033545 Document Type: Article

Times cited : (63)

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