Nanotopographical imaging using a heated atomic force microscope cantilever probe

Sensors and Actuators, A: Physical

Volumn 136, Issue 1, 2007, Pages 95-103

  Kim, K J ^a   Park, K ^a   Lee, J ^a   Zhang, Z M ^a   King, W P ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Atomic force microscopy; Cantilever; Thermal microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION GRATINGS; NANOSTRUCTURED MATERIALS; SILICA;

HEATED CANTILEVERS; NANOTOPOGRAPHICAL IMAGING; THERMAL MICROSCOPY;

IMAGING SYSTEMS;

EID: 34247117252     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2006.10.052     Document Type: Article

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