Low-frequency noise in silicon-on-insulator devices and technologies

Solid-State Electronics

Volumn 51, Issue 1, 2007, Pages 16-37

  Simoen, E ^a   Mercha, A ^a   Claeys, C ^a,b   Lukyanchikova, N ^c  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Flicker noise; Floating body effects; Front back gate coupling; Low frequency noise; Multi gate FETs; Silicon on insulator (SOI)

Indexed keywords

CARRIER CONCENTRATION; ELECTRON TRAPS; GATES (TRANSISTOR); MOSFET DEVICES; SPURIOUS SIGNAL NOISE; SUBSTRATES;

FLICKER NOISE; FLOATING BODY EFFECTS; FRONT BACK GATE COUPLING; LOW FREQUENCY NOISE;

SILICON ON INSULATOR TECHNOLOGY;

EID: 33846592716     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2006.12.003     Document Type: Review

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