Noise in advanced electronic devices and circuits

AIP Conference Proceedings

Volumn 780, Issue , 2005, Pages 3-12

  Deen, M Jamal ^a   Marinov, O ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

1 F noise; Degradation and reliability; Electrical stress; Flicker noise; Noise in devices; RF integrated circuits; RTS and phase noise; VCO; VCO with AAC

Indexed keywords

EID: 33749476202     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2036687     Document Type: Conference Paper

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