Low Frequency Noise Measurements at Elevated Temperatures on Thin-Film SOI n-MOSFET

European Solid-State Device Research Conference

Volumn , Issue , 1998, Pages 604-607

  Dessard, V ^a   Flandre, D ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; SOLS;

ELEVATED TEMPERATURE; FIRST-ORDER; FULLY DEPLETED; LOW-FREQUENCY NOISE MEASUREMENTS; NMOSFET; NMOSFETS; NOISE CONTRIBUTIONS; ROOM TEMPERATURE;

MOSFET DEVICES;

EID: 0002832328     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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