Low frequency noise in 0.12 μm partially and fully depleted SOI technology

Microelectronics Reliability

Volumn 43, Issue 2, 2003, Pages 243-248

  Dieudonné, François ^a   Haendler, Sébastien ^a   Jomaah, Jalal ^a   Balestra, Francis ^a  

^a IMEP LAHC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE;

DRAIN CURRENT;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0037301827     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00279-2     Document Type: Conference Paper

References (17)

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