Correlation between low-frequency noise overshoot in SOI MOSFETs and frequency dependence of floating body effect

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1997, Pages 99-100

  Tseng, Y C ^a   Huang, W M ^a   Babcock, J A ^a   Ford, J M ^a   Woo, J C S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC FREQUENCY MEASUREMENT; ELECTRON TUNNELING; FREQUENCY RESPONSE; MATHEMATICAL MODELS; OXIDES; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE; VOLTAGE MEASUREMENT;

FLOATING BODY EFFECTS; KINK RELATED NOISE OVERSHOOT;

MOSFET DEVICES;

EID: 0030647288     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/vlsit.1997.623714     Document Type: Conference Paper

References (6)