Impact of latch phenomenon on low frequency noise in soi mosfets

European Solid-State Device Research Conference

Volumn , Issue , 1996, Pages 87-90

  Jomaah, J ^a   Dixkens, D ^a   Pelloie, J L ^b   Raynaud, C ^b   Balestra, F ^a  

^a Grenoble INP Phelma   (France)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LOW-FREQUENCY NOISE; SOI-MOSFETS;

EID: 3042988745     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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4. I.M. Hafez et al., IEEE Electon Dev. Lett., EDL-11, 120 (1990).
5. J.P. Colinge, IEEE Electon Dev. Lett., EDL-9, 97 (1988).
6. C.E.D. Chen et al., IEEE Electon Dev. Lett., EDL-9, 636 (1988).
7. G. Ghibaudo et al., Physica Status Solidi (a) 124, 571 (1991).