Minimizing body instability in deep sub-micron SOI MOSFETs for sub-1V RF applications

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1999, Pages 27-28

  Tseng, Y C ^a   Huang, W M ^a   Mendicino, M ^a   Welch, P ^a   Ilderem, V ^a   Woo, J C S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; IONIZATION; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE; STABILITY; TEMPERATURE;

BODY INSTABILITY; EXCESS NOISE; IMPACT IONIZATION CURRENT; KINK EFFECTS;

MOSFET DEVICES;

EID: 0033280896     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)