메뉴 건너뛰기




Volumn 21, Issue 10, 2000, Pages 494-496

AC floating body effects in partially depleted floating body SOI nMOS operated at elevated temperature: An analog circuit prospective

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE;

EID: 0034298166     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.870612     Document Type: Article
Times cited : (5)

References (13)
  • 2
    • 0029185370 scopus 로고
    • Silicon-on-insulator technology for high temperature metal oxide semiconductor devices and circuits
    • D. Flandre, "Silicon-on-insulator technology for high temperature metal oxide semiconductor devices and circuits," High Temp. Electron., pp. 7-12, 1994.
    • (1994) High Temp. Electron. , pp. 7-12
    • Flandre, D.1
  • 3
    • 0030084276 scopus 로고    scopus 로고
    • Design of SOI CMOS operational amplifiers for application up to 300 °C
    • J. P. Eggermont et al., "Design of SOI CMOS operational amplifiers for application up to 300 °C," IEEE J. Solid-State Circuits, vol. 31, pp. 179-186, 1996.
    • (1996) IEEE J. Solid-state Circuits , vol.31 , pp. 179-186
    • Eggermont, J.P.1
  • 5
    • 0031643542 scopus 로고    scopus 로고
    • Comprehensive study on AC characteristics in SOI MOSFET's for analog applications
    • Y.-C. Tseng et al., "Comprehensive study on AC characteristics in SOI MOSFET's for analog applications," in Proc. Symp. VLSI Technology, 1998, pp. 112-113.
    • (1998) Proc. Symp. VLSI Technology , pp. 112-113
    • Tseng, Y.-C.1
  • 6
    • 0002082142 scopus 로고    scopus 로고
    • Phase noise characteristics associated with low-frequency noise in sub-micron SOI MOSFET feedback oscillator for RF IC's
    • Jan.
    • Y.-C. Tseng et al., "Phase noise characteristics associated with low-frequency noise in sub-micron SOI MOSFET feedback oscillator for RF IC's," IEEE Electron Device Lett., vol. 20, pp. 54-56, Jan. 1999.
    • (1999) IEEE Electron Device Lett. , vol.20 , pp. 54-56
    • Tseng, Y.-C.1
  • 7
    • 0030701037 scopus 로고    scopus 로고
    • TFSOI technology for portable wireless communication systems
    • W. M. Huang et al., "TFSOI technology for portable wireless communication systems," in Proc. IEEE Custom Integrated Circuits Conf., 1997, pp. 421-426.
    • (1997) Proc. IEEE Custom Integrated Circuits Conf. , pp. 421-426
    • Huang, W.M.1
  • 8
    • 0032069645 scopus 로고    scopus 로고
    • Empirical correlation between AC kink and low-frequency noise overshoot in SOI MOSFET's
    • Y.-C. Tseng et al., "Empirical correlation between AC kink and low-frequency noise overshoot in SOI MOSFET's," IEEE Electron Device Lett., vol. 19, no. 5, pp. 157-159, 1998.
    • (1998) IEEE Electron Device Lett. , vol.19 , Issue.5 , pp. 157-159
    • Tseng, Y.-C.1
  • 9
    • 0031076514 scopus 로고    scopus 로고
    • AC output conductance of SOI MOSFET's and impact on analog applications
    • Feb.
    • D. Sinitsky et al., "AC output conductance of SOI MOSFET's and impact on analog applications," IEEE Electron Device Lett., vol. 18, pp. 36-38, Feb. 1997.
    • (1997) IEEE Electron Device Lett. , vol.18 , pp. 36-38
    • Sinitsky, D.1
  • 11
    • 0033280896 scopus 로고    scopus 로고
    • Minimizing body instability in deep sub-micron SOI MOSFET's for sub-1 V RF applications
    • Y.-C. Tseng et al., "Minimizing body instability in deep sub-micron SOI MOSFET's for sub-1 V RF applications," in Proc. Symp. VLSI Technology, 1999, pp. 27-28.
    • (1999) Proc. Symp. VLSI Technology , pp. 27-28
    • Tseng, Y.-C.1
  • 12
    • 0032595839 scopus 로고    scopus 로고
    • Floating body induced pre-kink excess low-frequency noise in submicron SOI CMOSFET technology
    • Sept.
    • Y.-C. Tseng et al., "Floating body induced pre-kink excess low-frequency noise in submicron SOI CMOSFET technology," IEEE Electron Device Lett., vol. 20, pp. 484-486, Sept. 1999.
    • (1999) IEEE Electron Device Lett. , vol.20 , pp. 484-486
    • Tseng, Y.-C.1
  • 13
    • 0032314370 scopus 로고    scopus 로고
    • A physical-based low-frequency noise model for NFD SOI MOSFET's
    • W. Jin, P. C. H. Chan, S. K. H. Fung, and P. K. Ko, "A physical-based low-frequency noise model for NFD SOI MOSFET's," in Proc. IEEE Int. SOI Conf., 1998, pp. 23-24.
    • (1998) Proc. IEEE Int. SOI Conf. , pp. 23-24
    • Jin, W.1    Chan, P.C.H.2    Fung, S.K.H.3    Ko, P.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.