Low-frequency noise in near-fully-depleted TFSOI MOSFET's

IEEE Electron Device Letters

Volumn 19, Issue 2, 1998, Pages 40-43

  Babcock, Jeffrey A ^a   Schroder, Dieter K ^a   Tseng, Ying Che ^b  

^a Arizona State University   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SIGNAL NOISE MEASUREMENT; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE; THIN FILM TRANSISTORS;

LOW FREQUENCY NOISE;

MOSFET DEVICES;

EID: 0031999355     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.658597     Document Type: Article

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