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Volumn , Issue , 1998, Pages 949-952
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Device design methodology to optimize low-frequency noise in advanced SOI CMOS technology for RF IC's
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
FIELD EFFECT TRANSISTORS;
INTEGRATED CIRCUIT LAYOUT;
SILICON ON INSULATOR TECHNOLOGY;
SPURIOUS SIGNAL NOISE;
RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC);
CMOS INTEGRATED CIRCUITS;
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EID: 0032276256
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (9)
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