Geometry dependence of 1/f noise in n- and p-channel MuGFETs

AIP Conference Proceedings

Volumn 780, Issue , 2005, Pages 279-282

  Subramanian, V ^a,b   Mercha, A ^a   Dixit, A ^a,b   Anil, K G ^a   Jurczak, M ^a   De Meyer, K ^a,b   Decoutere, S ^a   Maes, H ^a,b   Groeseneken, G ^a,b   Sansen, W ^b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

1 f Noise; FinFET; MuGFET

Indexed keywords

EID: 33749488721     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2036749     Document Type: Conference Paper

References (5)

1. V.Kilchytska et al, IEEE Trans. Electr. Dev 48, pp. 65-68 (2004)
2. A.Dixit et al, Proc. of Tech. Papers, Intl. Symposium on VLSI Tech., pp. 112-113 (2005)
3. M.Valenza et al, IEE Proc. Circuits Devices Syst 151, pp. 102-110 (2004)
4. T.Boutchacha et al, Proc. Intl Conf. on Microelectronic Test Structures 12, pp. 84-88 (1999)
5. F.Dieudonne et al, IEEE Intl. SOI Conference, pp. 105-106 (2002)