The low-frequency noise behaviour of silicon-on-insulator technologies

Solid-State Electronics

Volumn 39, Issue 7, 1996, Pages 949-960

  Simoen, E ^a   Claeys, C ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DIELECTRIC MATERIALS; MOSFET DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SPURIOUS SIGNAL NOISE; SUBSTRATES;

GENERATION RECOMBINATION NOISE; RANDOM TELEGRAPH SIGNALS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0030193606     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(95)00427-0     Document Type: Review

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