Shot-noise-induced excess low-frequency noise in floating-body partially depleted SOI MOSFET's

IEEE Transactions on Electron Devices

Volumn 46, Issue 6, 1999, Pages 1180-1185

  Jin, Wei ^a   Chan, Philip C H ^a   Fung, Samuel K H ^a   Ko, Ping K ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; SEMICONDUCTOR DOPING; SHOT NOISE; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE;

EXCESS LOW FREQUENCY NOISE; FLOATING BODY EFFECT;

MOSFET DEVICES;

EID: 0032632929     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.766881     Document Type: Article

References (12)