Towards an integrated materials characterization toolbox

Journal of Materials Research

Volumn 26, Issue 11, 2011, Pages 1341-1383

  Robertson, Ian M ^a   Schuh, Christopher A ^b   Vetrano, John S ^c   Browning, Nigel D ^d   Field, David P ^e   Jensen, Dorte Juul ^f   Miller, Michael K ^g   Baker, Ian ^h   Dunand, David C ⁱ   Dunin Borkowski, Rafal ^j   Kabius, Bernd ^g   Kelly, Tom ^k   Lozano Perez, Sergio ^l   Misra, Amit ^m   Rohrer, Gregory S ⁿ   Rollett, Anthony D ^o   Taheri, Mitra L ^p   Thompson, Greg B ^q   Uchic, Michael ^r   Wang, Xun Li ^h   Was, Gary ^s   more..

^a University of Illinois at Urbana Champaign   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c U S DEPARTMENT OF ENERGY   (United States)

^d University of California   (United States)

^e LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^f Washington State University   (United States)

^g TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^h OAK RIDGE NATIONAL LABORATORY   (United States)

ⁱ DARTMOUTH COLLEGE   (United States)

^j Northwestern University   (United States)

^k ARGONNE NATIONAL LABORATORY   (United States)

^l CAMECA   (United States)

^m UNIVERSITY OF OXFORD   (United Kingdom)

ⁿ LOS ALAMOS NATIONAL LABORATORY   (United States)

^o CARNEGIE MELLON UNIVERSITY   (United States)

^p Drexel University   (United States)

^q UNIVERSITY OF ALABAMA   (United States)

^r AIR FORCE RESEARCH LABORATORY   (United States)

^s UNIVERSITY OF MICHIGAN   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS METHOD; ATOM PROBE TOMOGRAPHY; COMPLEX STRUCTURE; ELECTRON TOMOGRAPHY; GRAND CHALLENGE; INTEGRATED MATERIALS; MATERIAL CHARACTERIZATIONS; MATERIAL DAMAGES; MATERIAL SCIENTISTS; MATERIAL STRUCTURE; MATERIALS SCIENCE AND ENGINEERING; MICRO-STRUCTURAL CHARACTERIZATION; MICROSTRUCTURE ANALYSIS; MULTIPLE ORDERS; MULTISCALE PROBLEM; REACTION DYNAMICS; SERIAL SECTIONING; SINGLE STRUCTURE; SPATIAL SPACES;

ELECTRIC IMPEDANCE TOMOGRAPHY; MATERIALS;

CHARACTERIZATION;

EID: 80655138943     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2011.41     Document Type: Review

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