Introduction: The Otto Scherzer special issue on aberration-corrected electron microscopy

Microscopy and Microanalysis

Volumn 16, Issue 4, 2010, Pages 365-

  Smith, David J ^a   Dahmen, Uli ^a  

^a NONE

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EID: 77957243990     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610093700     Document Type: Editorial

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