X-ray diffraction contrast tomography: A novel technique for three-dimensional grain mapping of polycrystals. II. The combined case

Journal of Applied Crystallography

Volumn 41, Issue 2, 2008, Pages 310-318

  Johnson, Greg ^a,b   King, Andrew ^a,b   Honnicke, Marcelo Goncalves ^b   Marrow, J ^a   Ludwig, Wolfgang ^b,c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITÉ DE LYON   (France)

Author keywords

Diffraction contrast; Microtomography; Polycrystals; Synchrotron radiation; Three dimensional grain mapping

Indexed keywords

EID: 40849116274     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808001726     Document Type: Article

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