Application of image processing to STEM tomography of low-contrast materials

Ultramicroscopy

Volumn 110, Issue 1, 2009, Pages 67-81

  Ortalan, V ^a   Herrera, M ^a   Morgan, D G ^a,b   Browning, N D ^a,c  

^a University of California   (United States)

^b INDIANA UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Electron tomography; Heterostructured superconductors; Image processing; Low contrast materials; Scanning transmission electron microscopy

Indexed keywords

COATED SUPERCONDUCTOR; CONTRAST MATERIAL; ELECTRON TOMOGRAPHY; HETEROSTRUCTURED SUPERCONDUCTORS; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGE SHARPENING; LOW-CONTRAST MATERIALS; NON-UNIFORM THICKNESS; NUMBER DENSITY; PROCESSING METHOD; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SHAPE AND SIZE; SPATIAL DISTRIBUTION; STRUCTURAL FEATURE; TOMOGRAPHIC RECONSTRUCTION;

EDGE DETECTION; ELECTRIC FIELD MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON MICROSCOPES; ELECTRONS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGING SYSTEMS; NANOPARTICLES; PROCESSING; RECONSTRUCTION (STRUCTURAL); SCANNING; SCANNING ELECTRON MICROSCOPY; SIZE DISTRIBUTION; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY; VISIBILITY;

IMAGE RECONSTRUCTION;

BARIUM DERIVATIVE; COPPER DERIVATIVE; NANOPARTICLE; OXYGEN DERIVATIVE; YTTRIUM;

ARTICLE; ARTIFACT; CLASSIFICATION; CONDUCTOR; CONTRAST ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; THICKNESS;

EID: 70449134620     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.09.007     Document Type: Article

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