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Volumn 516, Issue 22, 2008, Pages 8013-8021

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies

Author keywords

3D X ray microscopy; Microbeams; Nanodiffraction; Nanostructures; Polychromatic microdiffraction

Indexed keywords

ALUMINA; CHARGE COUPLED DEVICES; COMPUTER SYSTEMS; CONTROL SYSTEMS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DIFFRACTION; DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; EPITAXIAL FILMS; GERMANIUM; GROWTH (MATERIALS); HOLOGRAPHIC INTERFEROMETRY; INTERCONNECTION NETWORKS; INTERFEROMETRY; LIGHT METALS; MAPS; MATERIALS; MOLECULAR BEAM EPITAXY; NICKEL; OXIDE FILMS; SCANNING; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; SUPERCONDUCTING FILMS; THREE DIMENSIONAL; X RAY DIFFRACTION; X RAY MICROSCOPES; X RAYS; ZINC OXIDE;

EID: 50649111178     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.045     Document Type: Article
Times cited : (25)

References (54)
  • 3
    • 1642603941 scopus 로고    scopus 로고
    • High-Resolution Three-Dimensional X-Ray Microscopy
    • Larson B.C., and Lengeler B. High-Resolution Three-Dimensional X-Ray Microscopy. Mater. Res. Soc. Bull. 29 (2004) 152
    • (2004) Mater. Res. Soc. Bull. , vol.29 , pp. 152
    • Larson, B.C.1    Lengeler, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.