Three-dimensional texture analysis

Materials Science Forum

Volumn 495-497, Issue PART 1, 2005, Pages 237-242

  Mulders, J J L ^a   Day, A P ^b  

^a Thermo Fisher Scientific   (United States)

^b HKL Technology ApS   (Denmark)

Author keywords

3D microscopy; Crystallography; DualBeam geometry and automation; EBSD; EBSP; Focused ion beam; Interpretation; Visualisation

Indexed keywords

ALUMINUM; BACKSCATTERING; COMPUTER SOFTWARE; CRYSTALLOGRAPHY; ELECTRONS; FOCUSED ION BEAMS;

3D MICROSCOPY; CONTROL SOFTWARES; DUALBEAM GEOMETRY AND AUTOMATION; GEOMETRIC CONSIDERATIONS;

TEXTURES;

EID: 35348845159     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-975-x.237     Document Type: Conference Paper

References (5)

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2. Søren Schmidt, et al., In-situ measurements of nuclei within the bulk of deformed Al..., Materials Science Forum, Vols. 467-470, pp. 189-192, 2004.
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4. V. Sivel, NIMR, Rotterdam, The Netherlands, private communication
5. G.S. Rohrer, D.M. Saylor, B.S. El-Dasher, B.L. Adams, A.D. Rollett, and P. Wynblatt, The Distribution of Internal Interfaces in Polycrystals, Zeitschrift fur Metallkunde, 95, pp. 197-214, 2004. Available on-line at: http://mimp.materials.cmu.edu/papers/2004_05.pdf