X-ray diffraction contrast tomography: A novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

Journal of Applied Crystallography

Volumn 41, Issue 2, 2008, Pages 302-309

  Ludwig, Wolfgang ^a,b   Schmidt, Søeren ^c   Lauridsen, Erik Mejdal ^c   Poulsen, Henning Friis ^c  

^a UNIVERSITÉ DE LYON   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Diffraction contrast; Microtomography; Polycrystals; Synchrotron radiation; Three dimensional grain mapping

Indexed keywords

EID: 40849114660     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808001684     Document Type: Article

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