Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary

Ultramicroscopy

Volumn 110, Issue 4, 2010, Pages 278-284

  Taheri, Mitra L ^a   Sebastian, Jason T ^b,c   Reed, Bryan W ^d   Seidman, David N ^c   Rollett, Anthony D ^e  

^a Drexel University   (United States)

^b QuesTek Innovations LLC   (United States)

^c Northwestern University   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Atom probe; EBSD; FIB; Grain boundary segregation; TEM

Indexed keywords

ATOM PROBE; ATOMIC-SCALE ANALYSIS; COINCIDENCE SITE LATTICE GRAIN BOUNDARIES; ELECTRODE ATOM PROBE; ELECTRON BACK SCATTER DIFFRACTION; FOCUSED ION BEAM MILLING; GRAIN BOUNDARY SEGREGATION; MISORIENTATIONS; SITE-SPECIFIC; SOLUTE SEGREGATION; TEM; THREE DIMENSIONS;

ALLOYING; ALLOYING ELEMENTS; ALUMINUM; ALUMINUM ALLOYS; ATOMS; COPPER ALLOYS; ELECTRON DIFFRACTION; FOCUSED ION BEAMS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PROBES; ZIRCONIUM;

SEGREGATION (METALLOGRAPHY);

ALUMINUM; COPPER; ZINC;

ACCURACY; ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CONTROLLED STUDY; ELECTRON BACKSCATTER DIFFRACTION; FOCUSED ION BEAM; IMAGE ANALYSIS; IMAGING SYSTEM; INTERMETHOD COMPARISON; PARTICLE SIZE; SEGREGATION ANALYSIS; SITE SPECIFIC LOCAL ELECTRODE ATOM PROBE; SOLUTE; SPECTROSCOPY;

EID: 77649183420     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.006     Document Type: Article

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