High-resolution electron backscatter diffraction: An emerging tool for studying local deformation

Journal of Strain Analysis for Engineering Design

Volumn 45, Issue 5, 2010, Pages 365-376

  Wilkinson, A J ^a   Clarke, E E ^a   Britton, T B ^a   Littlewood, P ^a   Karamched, P S ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

diffraction patterns; high resolution electron backscatter diffraction; microscale deformation; scanning electron microscopy

Indexed keywords

CROSS CORRELATIONS; DIFFRACTION TECHNIQUES; DUAL-PHASE STEEL; EBSD PATTERN; ELASTIC STRAIN; ELECTRON BACK SCATTER DIFFRACTION; GEOMETRICALLY NECESSARY DISLOCATIONS; HIGH RESOLUTION; HIGH SPATIAL RESOLUTION; LATTICE CURVATURE; LATTICE ROTATIONS; LOCAL DEFORMATIONS; MICROSCALE DEFORMATION; POLYCRYSTALLINE; TI-6AL-4V ALLOY; WILKINSON;

BACKSCATTERING; CARBIDES; CERIUM ALLOYS; DEFORMATION; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRONS; GRAIN BOUNDARIES; HOLOGRAPHIC INTERFEROMETRY; NANOINDENTATION; SCANNING; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; TITANIUM ALLOYS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 77954687878     PISSN: 03093247     EISSN: None     Source Type: Journal    
DOI: 10.1243/03093247JSA587     Document Type: Article

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