In situ electron microscopy methods

Microscopy Research and Technique

Volumn 72, Issue 3, 2009, Pages 121-

  Clark, Blythe G ^a   Ferreira, Paulo ^b   Robertson, Ian M ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IN-SITU ELECTRON MICROSCOPY;

ELECTRON MICROSCOPY;

EDITORIAL; ELECTRON MICROSCOPY; MAGNETIC FIELD; MICROELECTROMECHANICAL SYSTEM; NANODEVICE; NANOELECTROMECHANICAL SYSTEM; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 61449132426     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20663     Document Type: Editorial

References (0)