Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy

Science and Technology of Advanced Materials

Volumn 7, Issue 7, 2006, Pages 726-731

  Kaneko, Kenji ^a   Nagayama, Ryo ^a   Inoke, Koji ^a,b   Noguchi, Etsuko ^a   Horita, Zenji ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b Thermo Fisher Scientific   (United States)

Author keywords

Al Si alloy; Electron tomography; Si phases; TEM

Indexed keywords

ALUMINUM; ELECTRON DIFFRACTION; IMAGING TECHNIQUES; INFORMATION RETRIEVAL; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

AL SI ALLOY; BRIGHT FIELD IMAGING; ELECTRON TOMOGRAPHY; SI PHASES;

COMPUTERIZED TOMOGRAPHY;

EID: 37849186102     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.stam.2006.06.006     Document Type: Article

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