In situ transmission electron microscopy investigation of radiation effects

Journal of Materials Research

Volumn 20, Issue 7, 2005, Pages 1654-1683

  Birtcher, R C ^a   Kirk, M A ^a   Furuya, K ^b   Lumpkin, G R ^c   Ruault, M O ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d 91405 Orsay Campus   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ANNEALING; ELECTRON IRRADIATION; ION BEAMS; PLASTIC FLOW; PRECIPITATION (CHEMICAL); RADIATION EFFECTS;

ION IRRADIATION; ION-BEAM AMORPHIZATION; THERMAL ANNEALING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 29144524696     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0242     Document Type: Review

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