Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 356-367

  Armstrong, Michael R ^a   Boyden, Ken ^a   Browning, Nigel D ^a,b   Campbell, Geoffrey H ^a   Colvin, Jeffrey D ^a   DeHope, William J ^a   Frank, Alan M ^a   Gibson, David J ^a   Hartemann, Fred ^a   Kim, Judy S ^a,b   King, Wayne E ^a   LaGrange, Thomas B ^a   Pyke, Ben J ^a   Reed, Bryan W ^a   Shuttlesworth, Richard M ^a   Stuart, Brent C ^a   Torralva, Ben R ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b University of California   (United States)

Author keywords

Electron microscope design and characterization; Electron sources; Particle optics

Indexed keywords

CURRENT DENSITY; ELECTRON SOURCES; ELECTRONS; FIELD EMISSION MICROSCOPES; OPTICAL RESOLVING POWER; PARTICLE OPTICS; THERMIONIC EMISSION;

ELECTRON MICROSCOPE DESIGN; PHOTOEXCITED ELECTRONS; SPATIAL RESOLUTION;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON DIFFRACTION; PULSE WAVE; STROBOSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33846351499     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.09.005     Document Type: Article

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