Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory

Advances in Imaging and Electron Physics

Volumn 153, Issue , 2008, Pages 481-523

  Zhu, Yimei ^a   Wall, Joe ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; ELECTRONS; IMAGE RESOLUTION;

ABERRATION CORRECTION; ABERRATION-CORRECTED; BROOKHAVEN NATIONAL LABORATORY; COLD FIELD EMISSIONS; ELECTRONIC STABILITY; ENVIRONMENTAL REQUIREMENT; HIGH BRIGHTNESS; SPATIAL RESOLUTION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 67649389804     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)01012-4     Document Type: Chapter

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